Our client TeraProbes, Inc. has recently sold one of their non-contact probe stations to the U.S. National Institute of Standards and Technology (NIST). Over the past few years, RF-Electronics Group at NIST has been collaborating with the TeraProbes team under a NIST-TeraProbes CRADA. Today, one of TeraProbes non-contact probe stations are being permanently housed at NIST. This product is the world’s first non-contact metrology solution for high frequency electronic devices and IC testing. It is automated, enabling unattended inspection of every single chip on a wafer at the fraction of the cost.

Occam Technology Group was excited to be chosen as the engineering team that would commercialize TeraProbes intellectual property. Our mission was to work from industrial design through engineering, to manufacturer both machined components and molded parts, and to even develop the maintenance and operating procedures that would be included with each Wafer Tester. TeraProbes, Inc. was formed in 2014 as a spin-off research center at the Electrical and Computer Engineering Department at The Ohio State University. They believe their non-contact probing technology can help alleviate pains in the high-speed electronics industry associated with contact probe wear & tear, contact repeatability, and extremely-high hardware and operation costs associated with on-wafer device and IC characterization. We look forward to a continued relationship and much success for the future!